Posts Samsung power outage causes up to 60,000 wafers damaged for NAND flash memory
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Samsung power outage causes up to 60,000 wafers damaged for NAND flash memory

http://www.guru3d.com/news-story/samsung-power-outage-causes-up-to-60000-wafers-damaged-for-nand-flash-memory.html

origin - https://www.pipiscrew.com/2018/03/samsung-power-outage-causes-up-to-60000-wafers-damaged-for-nand-flash-memory/ samsung-power-outage-causes-up-to-60000-wafers-damaged-for-nand-flash-memory

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